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1

Lean production, Toyota Production System and Kaizen philosophy

Chiarini, Andrea, Baccarani, Claudio, Mascherpa, Vittorio

Journal:

The TQM Journal

Year:

2018

Language:

english

File:

PDF, 205 KB

english, 2018

2

Effective public speaking: a conceptual framework in the corporate-communication field

Baccarani, Claudio, Bonfanti, Angelo

Journal:

Corporate Communications An International Journal

Year:

2015

Language:

english

File:

PDF, 285 KB

english, 2015

3

Theory of the Junctionless Nanowire FET

Gnani, E., Gnudi, A., Reggiani, S., Baccarani, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 483 KB

english, 2011

4

Climate change and organizational management: toward a new paradigm

Baccarani, Claudio, Brunetti, Federico, Martin, Jacques

Journal:

The TQM Journal

Year:

2020

File:

PDF, 619 KB

2020

5

A simple trick for optimizing the three-vein technique outflow anastomosis in piggyback liver transplantation

Umberto Baccarani, Vittorio Cherchi, Anna Rossetto, Dario Lorenzin, Gian Luigi Adani

Journal:

Liver Transplantation

Year:

2011

Language:

english

File:

PDF, 41 KB

english, 2011

6

Theoretical analysis of the vertical LOCOS DMOS transistor with process-induced stress enhancement

S. Reggiani, M. Denison, E. Gnani, A. Gnudi, G. Baccarani, S. Pendharkar, R. Wise

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.00 MB

english, 2010

7

Electron and hole mobility in silicon at large operating temperatures. I. Bulk mobility

Reggiani, S., Valdinoci, M., Colalongo, L., Rudan, M., Baccarani, G., Stricker, A.D., Illien, F., Felber, N., Fichtner, W., Zullino, L.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 228 KB

english, 2002

8

Generalized scaling theory and its application to a ¼ micrometer MOSFET design

Baccarani, G., Wordeman, M.R., Dennard, R.H.

Journal:

IEEE Transactions on Electron Devices

Year:

1984

Language:

english

File:

PDF, 1.24 MB

english, 1984

9

Measurement and modeling of the electron impact-ionization coefficient in silicon up to very high temperatures

Reggiani, S., Gnani, E., Rudan, M., Baccarani, G., Corvasce, C., Barlini, D., Ciappa, M., Fichtner, W., Denison, M., Jensen, N., Groos, G., Stecher, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2005

Language:

english

File:

PDF, 942 KB

english, 2005

10

Physical Model of the Junctionless UTB SOI-FET

Gnani, E., Gnudi, A., Reggiani, S., Baccarani, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 672 KB

english, 2012

11

Once-Daily Prolonged-Release Tacrolimus (ADVAGRAF) Versus Twice-Daily Tacrolimus (PROGRAF) in Liver Transplantation

P. Trunečka, O. Boillot, D. Seehofer, A. D. Pinna, L. Fischer, B.-G. Ericzon, R. I. Troisi, U. Baccarani, J. Ortiz de Urbina, W. Wall, for the Tacrolimus Prolonged Release Liver Study Group

Journal:

American Journal of Transplantation

Year:

2010

Language:

english

File:

PDF, 301 KB

english, 2010

12

[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - Full understanding of hot-carrier-induced degradation in STI-based LDMOS transistors in the impact-ionization operating regime

Poli, S., Reggiani, S., Baccarani, G., Gnani, E., Gnudi, A., Denison, M., Pendharkar, S., Wise, R.

Year:

2011

Language:

english

File:

PDF, 920 KB

english, 2011

13

TCAD Simulation of Hot-Carrier and Thermal Degradation in STI-LDMOS Transistors

Reggiani, Susanna, Barone, Gaetano, Poli, Stefano, Gnani, Elena, Gnudi, Antonio, Baccarani, Giorgio, Chuang, Ming-Yeh, Tian, Weidong, Wise, Rick

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.03 MB

english, 2013

14

Social media marketing in the wellness industry

Claudio Baccarani and Dr Jacques Ma, Professor, Olof Lagrosen, Stefan, Grundén, Kerstin

Journal:

The TQM Journal

Year:

2014

Language:

english

File:

PDF, 71 KB

english, 2014

15

Characterization and modeling of electrical stress degradation in STI-based integrated power devices

Reggiani, Susanna, Barone, Gaetano, Gnani, Elena, Gnudi, Antonio, Baccarani, Giorgio, Poli, Stefano, Wise, Rick, Chuang, Ming-Yeh, Tian, Weidong, Pendharkar, Sameer, Denison, Marie

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 1.98 MB

english, 2014

16

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Modeling and characterization of hot-carrier stress degradation in power MOSFETs (invited)

Reggiani, S., Gnani, E., Gnudi, A., Baccarani, G., Poli, S., Wise, R., Chuang, M. Y., Tian, W., Denison, M.

Year:

2013

Language:

english

File:

PDF, 815 KB

english, 2013

17

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Analysis of HCS in STI-based LDMOS transistors

Reggiani, Susanna, Poli, Stefano, Gnani, Elena, Gnudi, Antonio, Baccarani, Giorgio, Denison, Marie, Pendharkar, Sameer, Wise, Rick, Seetharaman, Sridhar

Year:

2010

Language:

english

File:

PDF, 695 KB

english, 2010

18

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Hot-carrier stress induced degradation in Multi-STI-Finger LDMOS: An experimental and numerical insight

Poli, S., Loi, A., Reggiani, S., Baccarani, G., Gnani, E., Gnudi, A., Denison, M., Pendharkar, S., Wise, R., Seetharaman, S.

Year:

2010

Language:

english

File:

PDF, 496 KB

english, 2010

19

Final 5-Year Study Results of DASISION: The Dasatinib Versus Imatinib Study in Treatment-Naive Chronic Myeloid Leukemia Patients Trial

Cortes, J. E., Saglio, G., Kantarjian, H. M., Baccarani, M., Mayer, J., Boque, C., Shah, N. P., Chuah, C., Casanova, L., Bradley-Garelik, B., Manos, G., Hochhaus, A.

Journal:

Journal of Clinical Oncology

Year:

2016

Language:

english

File:

PDF, 991 KB

english, 2016

20

The Distally Based Sural Flap

Follmar, Keith E., Baccarani, Alessio, Baumeister, Steffen P., Levin, L Scott, Erdmann, Detlev

Journal:

Plastic & Reconstructive Surgery

Year:

2007

Language:

english

File:

PDF, 2.91 MB

english, 2007

21

Evaluating the outcomes of service ecosystems

Baccarani, Claudio, Cassia, Fabio

Journal:

The TQM Journal

Year:

2017

Language:

english

File:

PDF, 229 KB

english, 2017

22

Characterization of dielectric properties and conductivity in encapsulation materials with high insulating filler contents

Cornigli, Davide, Reggiani, Susanna, Gnudi, Antonio, Gnani, Elena, Baccarani, Giorgio, Fabiani, Davide, Varghese, Dhanoop, Tuncer, Enis, Krishnan, Srikanth, Nguyen, Luu

Journal:

IEEE Transactions on Dielectrics and Electrical Insulation

Year:

2018

Language:

english

File:

PDF, 2.24 MB

english, 2018

23

Interpretation of C-V measurements for determining the doping profile in semiconductors

G. Baccarani, M. Rudan, G. Spadini, H. Maes, W. Vandervorst, R. Van Overstraeten

Journal:

Solid-State Electronics

Year:

1980

Language:

english

File:

PDF, 657 KB

english, 1980

24

A numerical approach to the solution of the Boltzmann transport equation for the analysis of hot-electron effects in semiconductors

Antonio Gnudi, Davide Ventura, Giorgio Baccarani

Journal:

Microelectronic Engineering

Year:

1992

Language:

english

File:

PDF, 525 KB

english, 1992

25

Theoretical foundations of the quantum drift-diffusion and density-gradient models

Giorgio Baccarani, Elena Gnani, Antonio Gnudi, Susanna Reggiani, Massimo Rudan

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 340 KB

english, 2008

26

Modeling of gate-all-around charge trapping SONOS memory cells

E. Gnani, S. Reggiani, A. Gnudi, G. Baccarani, J. Fu, N. Singh, G.Q. Lo, D.L. Kwong

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.07 MB

english, 2010

27

Impact-ionization coefficient in silicon at high fields— a

M. Rudan, R. Katilius, S. Reggiani, E. Gnani, G. Baccarani

Journal:

Journal of Computational Electronics

Year:

2008

Language:

english

File:

PDF, 284 KB

english, 2008

28

An investigation of steady-state velocity overshoot in silicon

G. Baccarani, M.R. Wordeman

Journal:

Solid-State Electronics

Year:

1985

Language:

english

File:

PDF, 926 KB

english, 1985

29

A comparison of advanced transport models for the computation of the drain current in nanoscale nMOSFETs

P. Palestri, C. Alexander, A. Asenov, V. Aubry-Fortuna, G. Baccarani, A. Bournel, M. Braccioli, B. Cheng, P. Dollfus, A. Esposito, D. Esseni, C. Fenouillet-Beranger, C. Fiegna, G. Fiori, A. Ghetti, G.

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 1.23 MB

english, 2009

30

Endoplasmic reticulum stress initiates apoptotic death induced by STI571 inhibition of p210 bcr–abl tyrosine kinase

Laura Pattacini, Manuela Mancini, Lucia Mazzacurati, Gianluca Brusa, Michela Benvenuti, Giovanni Martinelli, Michele Baccarani, Maria Alessandra Santucci

Journal:

Leukemia Research

Year:

2004

Language:

english

File:

PDF, 416 KB

english, 2004

31

Transport properties of polycrystalline silicon films

Baccarani, G., Ricco, B., Spadini, G.

Journal:

Journal of Applied Physics

Year:

1978

Language:

english

File:

PDF, 644 KB

english, 1978

32

Steep-slope nanowire FET with a superlattice in the source extension

E. Gnani, S. Reggiani, A. Gnudi, G. Baccarani

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 998 KB

english, 2011

33

Hot-carrier stress induced degradation in Multi-STI-Finger LDMOS: An experimental and numerical insight

S. Poli, S. Reggiani, G. Baccarani, E. Gnani, A. Gnudi, M. Denison, S. Pendharkar, R. Wise

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 790 KB

english, 2011

34

Numerical investigation on the junctionless nanowire FET

E. Gnani, A. Gnudi, S. Reggiani, G. Baccarani, N. Shen, N. Singh, G.Q. Lo, D.L. Kwong

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.01 MB

english, 2012

35

First Report of Cryopreserved Human Hepatocytes Based Bioartificial Liver Successfully Used as a Bridge to Liver Transplantation

Umberto Baccarani, Annibale Donini, Andrea Sanna, Andrea Risaliti, Alessio Cariani, Bruno Nardo, Antonino Cavallari, Gerardo Martinelli, Lorenza Ridolfi, Gianni Bellini, Mario Scalamogna, Fabrizio Bre

Journal:

American Journal of Transplantation

Year:

2004

Language:

english

File:

PDF, 126 KB

english, 2004

36

Depletion-mode m.o.s.f.e.t. model including a field-dependent surface mobility

Baccarani, G., Landini, F., RiccÃ², B.

Journal:

IEE Proceedings I Solid State and Electron Devices

Year:

1980

Language:

english

File:

PDF, 455 KB

english, 1980

37

Floating body effects in polysilicon thin-film transistors

Valdinoci, M., Colalongo, L., Baccarani, G., Fortunato, G., Pecora, A., Policicchio, I.

Journal:

IEEE Transactions on Electron Devices

Year:

1997

Language:

english

File:

PDF, 195 KB

english, 1997

38

Explanation of the Rugged LDMOS Behavior by Means of Numerical Analysis

Reggiani, S., Baccarani, G., Gnani, E., Gnudi, A., Denison, M., Pendharkar, S., Wise, R., Seetharaman, S.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 960 KB

english, 2009

39

A Low-Field Mobility Model for Bulk, Ultrathin Body SOI and Double-Gate n-MOSFETs With Different Surface and Channel Orientations—Part I: Fundamental Principles

Silvestri, L., Reggiani, S., Gnani, E., Gnudi, A., Baccarani, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 410 KB

english, 2010

40

Physics-Based Analytical Model for HCS Degradation in STI-LDMOS Transistors

Reggiani, S., Poli, S., Denison, M., Gnani, E., Gnudi, A., Baccarani, G., Pendharkar, S., Wise, R.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 1.13 MB

english, 2011

41

The Role of Hepatic Biopsy to Detect Macrovacuolar Steatosis During Liver Procurement

G.L. Adani, U. Baccarani, M. Sainz-Barriga, D. Lorenzin, V. Bresadola, A. Risaliti, C. Avellini, G. Trevisan, A. De Candia, F. Bresadola

Journal:

Transplantation Proceedings

Year:

2006

Language:

english

File:

PDF, 59 KB

english, 2006

42

Comparison of Two Techniques of Arterial Anastomosis During Adult Cadaveric Liver Transplantation

D. Lorenzin, G.L. Adani, C. Comuzzi, M. Sainz-Barriga, E. Benzoni, V. Bresadola, A. Risaliti, U. Baccarani, D. De Anna

Journal:

Transplantation Proceedings

Year:

2007

Language:

english

File:

PDF, 50 KB

english, 2007

43

Technical Solutions for Venous Outflow Reconstruction in Damaged Liver Grafts During Procurement: Case Reports

D. Nicolini, F. di Francesco, N. Cautero, S. De Luca, A. Vecchi, P. Garelli, G. Martorelli, P. Vincenzi, M. Gentili, U. Baccarani, G.L. Adani, A. Risaliti

Journal:

Transplantation Proceedings

Year:

2008

Language:

english

File:

PDF, 704 KB

english, 2008

44

Cardiovascular Risk Factors and Immunosuppressive Regimen After Liver Transplantation

A. Rossetto, D. Bitetto, V. Bresadola, D. Lorenzin, U. Baccarani, D. De Anna, F. Bresadola, G.L. Adani

Journal:

Transplantation Proceedings

Year:

2010

Language:

english

File:

PDF, 107 KB

english, 2010

45

An ASIC chip set for parallel fuzzy database mining

Ferrari, A., Bellettini, A., Guerrieri, R., Baccarani, G.

Journal:

Year:

1996

Language:

english

File:

PDF, 1.30 MB

english, 1996

46

Long-term follow-up of 386 consecutive patients with essential thrombocythemia: Safety of cytoreductive therapy

Francesca Palandri, Lucia Catani, Nicoletta Testoni, Emanuela Ottaviani, Nicola Polverelli, Mauro Fiacchini, Antonio De Vivo, Federica Salmi, Alessandro Lucchesi, Michele Baccarani, Nicola Vianelli

Journal:

American Journal of Hematology

Year:

2009

Language:

english

File:

PDF, 245 KB

english, 2009

47

A new discretization strategy of the semiconductor equations comprising momentum and energy balance

Forghieri, A., Guerrieri, R., Ciampolini, P., Gnudi, A., Rudan, M., Baccarani, G.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

1988

Language:

english

File:

PDF, 1.12 MB

english, 1988

48

Analysis of Threshold Voltage Variability Due to Random Dopant Fluctuations in Junctionless FETs

Gnudi, A., Reggiani, S., Gnani, E., Baccarani, G.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 323 KB

english, 2012

49

Drain-conductance optimization in nanowire TFETs by means of a physics-based analytical model

Gnani, E., Gnudi, A., Reggiani, S., Baccarani, G.

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 675 KB

english, 2013

50

[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - Numerical investigation on the junctionless nanowire FET

Gnani, E., Gnudi, A., Reggiani, S., Baccarani, G., Shen, N., Singh, N., Lo, G. Q., Kwong, D. L.

Year:

2011

Language:

english

File:

PDF, 297 KB

english, 2011

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